The FEI environmental scanning electron microscope is equipped with an Oxford X-Max Silicon Drift Detector (SDD). This high quality energy-dispersive X-ray (EDS) collector enables elemental analysis of micro-samples or micro-spots on large objects in the chamber. This large area detector allows accurate nano-analysis in less time than earlier generation equipment.
Applications:
- identification of pigment type
- forensic determination of possible arsenic in yellow pigments
- differentiation of iron gall ink from other inks
- elemental mapping of microscopic surface topography of library collection materials
- traditional: paper, parchment, ink, adhesives
- modern: magnetic tape, CDs, DVDs, plastics
- unique: glass, sensor ceramics, textiles
Example project: The Forbes Pigment Reference Collection
